Determination of the X-ray reflection emissivity profile of 1H0707-495

D.R. Wilkins and A.C. Fabian, 2011, MNRAS 414, 1269-1277

When considering the X-ray spectrum resulting from the reflection off the surface of accretion discs of AGN, it is necessary to account for the variation in reflected flux over the disc, i.e. the emissivity profile. This will depend on factors including the location and geometry of the X-ray source and the disc characteristics. We directly obtain the emissivity profile of the disc from the observed spectrum by considering the reflection component as the sum of contributions from successive radii in the disc and fitting to find the relative weightings of these components in a relativistically-broadened emission line. This method has successfully recovered known emissivity profiles from synthetic spectra and is applied to XMM-Newton spectra of the Narrow Line Seyfert 1 galaxy 1H 0707-495. The data imply a twice-broken power law form of the emissivity law with a steep profile in the inner regions of the disc (index 7.8) and then a flat region between 5.6rg and 34.8rg before tending to a constant index of 3.3 over the outer regions of the disc. The form of the observed emissivity profile is consistent with theoretical predictions, thus reinforcing the reflection interpretation.